[ Identification | Description | Input parameters | Output parameters | Links ]

The MAXII_811 Instrument

XAFS and surface diffraction, Materials Science Beamline 811 at MAX-lab.

Identification

Description

Fed by a wiggler, this beamline operates in monochromatic mode with an
operational energy tunable between 2.3 – 20 keV (0.6 - 5.3 AA).
The wavelength is chosen by a double monochromator crystal setup where either
Si 111 or Si 311 may be chosen. Furthermore a double mirror
setup may be used to to focus the beam onto a sample. The rotation of the
first mirror defines the position of the second which is computed automatically.
If mirrors are in the monochromators are automatically reposistioned to
accomadate the deflected beam. 

Example: mxrun Max2_811.instr M1=1 M2=1 M1_pitch=1 M2_pitch=1 theta=14.221

Input parameters

Parameters in boldface are required; the others are optional.
Name Unit Description Default
Emin keV energy range of radiation emitted from wiggler. 1e-3
Emax 12
prim_h m horizaontal and vertical opening of primary slits. .40e-3
prim_v 0.6e-3
xafs_h 3e-3
xafs_v 3e-3
M1 0
M1_R m Radius of curvature of mirror 1. 2000
M1_pitch deg Central glancing angle of mirror 1. 0
M2 0
M2_R m Radius of curvature of mirror 2. 800
M2_pitch deg Central glancing angle of mirror 2. 0
theta deg Scattering angle of monochromators 0
TTH deg angle at which to put the surface diffraction detector 0
ATT1 0
ATT2 0
ATT3 0
XAFS 0

Links


[ Identification | Description | Input parameters | Output parameters | Links ]

Generated automatically by McDoc, Peter Willendrup <peter.willendrup@risoe.dk> / Tue Nov 26 12:17:24 2019