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McXtrace - An X-ray ray-trace simulation package

ESRF; SAXSLAB Niels Bohr Institute DTU Physics

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McXtrace: Test_ML_elliptic Instrument at Tests

[ Identification | Description | Input parameters | Output parameters | Links ]

The Test_ML_elliptic Instrument

Unit test instrument for Multilayer_elliptic

Identification

  • Site: Tests
  • Author: Your name (email)
  • Origin: Your institution
  • Date: Current Date
  • Version: 0.2

Description

Tests the correct working of the mulitlyer_elliptic component both using a
reflectivity file and the kinematical approximation. 


Input parameters

Parameters in boldface are required; the others are optional.
Name Unit Description Default
S1 1
S2 2
gamma deg Design glancing angle at centre. 1.2
fromfile "reflectivity.txt" [ ] If nonzero read reflectivity number from a datafile 1

Links

  • Source code for Test_ML_elliptic.instr.
  • A reference/HTML link for more information

[ Identification | Description | Input parameters | Output parameters | Links ]

Generated automatically by McDoc, Peter Willendrup <peter.willendrup@risoe.dk> / Tue Nov 26 12:17:24 2019


Last Modified: Tuesday, 26-Nov-2019 13:17:24 CET
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