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McXtrace - An X-ray ray-trace simulation package

Synchrotron SOLEIL DTU Physics

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McXtrace: Multilayer_elliptic

[ Identification | Description | Input parameters | Output parameters | Links ]

The Multilayer_elliptic Component

Elliptic multilayer mirror

Identification

  • Site:
  • Author: Jana Baltser, Peter Willendrup, Anette Vickery, Andrea Prodi, Erik Knudsen
  • Origin: NBI
  • Date: February 2011

Description

Reads reflectivity values from a data input file (Ref.dat) for a Si/W multilayer.
The multilayer code reflects ray in an ideal geometry, does not include surface imperfections

The mirror is positioned such that the long axis of the mirror elliptical surface coincides with
z-axis

The algorithm:
Incoming photon's coordinates and direction (k-vector) are transformed into an elliptical reference frame
(elliptical parameters are calculated according to the mirror's position and its focusing distances and the
incident angle), the intersection point is then defined. A new, reflected photon is then starting at the
point of intersection.

Input parameters

Parameters in boldface are required; the others are optional.
NameUnitDescriptionDefault
reflectivity_datafile"reflectivity.txt"
theta1.2
s1
s2
length0.5
width0.2
R01
Emin-1
Emax-1
Estep-1
Gamma0
Lambda0
rho_AB0
N0

Output parameters

Parameters in boldface are required; the others are optional.
NameUnitDescriptionDefault
prms_m
a
b
c
M
Z0
Y0
xi
cost0

Links


[ Identification | Description | Input parameters | Output parameters | Links ]

Generated on 2022-02-07 21:31:39


Last Modified: Wednesday, 11-May-2022 22:46:11 CEST
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